Our research lab has several characterization techniques available in-house and ready for your project.
Contact us for more details about our analysis capabilities and how we can support your application.
| System Name | Analysis Type |
| Dektak 3ST | Layer thickness measurement |
| Filmetrics F20 UVX | Reflectance and transmission measurements for optical properties characterization and thickness measurements |
| Bruker D8 Discover XRD | Characterization of crystal structure and orientation |
| Hitachi SEM with EDX | Scanning electron microscope for high magnification imaging and composition analysis |
| Napson 4 Point Probe | Sheet resistance measurement |
| X-ray Fluorescence | Non-contact bulk composition and thickness |
| Optical light microscope with Nomarksi filters | Optical imaging of sample surfaces |
Bruker D8 XRD
Hitachi SEM