Our research lab has several characterization techniques available in-house and ready for your project.
Contact us for more details about our analysis capabilities and how we can support your application.
|System Name||Analysis Type|
|Dektak 3ST||Layer thickness measurement|
|Filmetrics F20 UVX||Reflectance and transmission measurements for optical properties characterization and thickness measurements|
|Bruker D8 Discover XRD||Characterization of crystal structure and orientation|
|Hitachi SEM with EDX||Scanning electron microscope for high magnification imaging and composition analysis|
|Napson 4 Point Probe||Sheet resistance measurement|
|X-ray Fluorescence||Non-contact bulk composition and thickness|
|Optical light microscope with Nomarksi filters||Optical imaging of sample surfaces|