June 28, 2016

Analysis Tools

Our research lab has several characterization techniques available in-house and ready for your project.

Contact us for more details about our analysis capabilities and how we can support your application.

System Name Analysis Type
Dektak 3ST Layer thickness measurement
Filmetrics F20 UVX Reflectance and transmission measurements for optical properties characterization and thickness measurements
Bruker D8 Discover XRD Characterization of crystal structure and orientation
Hitachi SEM with EDX Scanning electron microscope for high magnification imaging and composition analysis
Napson 4 Point Probe Sheet resistance measurement
X-ray Fluorescence Non-contact bulk composition and thickness
Optical light microscope with Nomarksi filters Optical imaging of sample surfaces


Bruker D8 XRD

Hitachi SEM